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Analytical Instrumentation MCQ Question Set 12
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1. Which of the following problems occur when combining gas chromatography and mass spectroscopy?
Difference in operating pressures
Reduction in sensitivity
Direct identification is not possible
It does not permit direct introduction of the effluent
2. The carrier gas with low molecular weight would diffuse at a higher rate than the higher molecular weight sample.
True
False
all of the above
None of the mentioned
3. Which of the following is the type of separator used in commercial GC-MS systems?
Jet type molecular separator
Porous tube
Teflon tube
Flow type separator
4. The system for measurement of ion intensity in GS-MS system consists of which of the following?
Electrometer
Ion meter
Ion transducer
Intensity meter
5. Introduction of total HPLC effluent into MS is feasible.
True
False
all of the above
None of the mentioned
6. The gas burden from conventional LC flow rates creates nearly _____ times more gas than cryo-pumped vacuum system can handle.
5
10
20
40
7. Which of the following should be in a position to split the effluent?
Interface
Ion source
Makeup gas
Microbore
8. Which of the following is the most commonly used interface?
Nebulizer
Chopper
Filter
Vapourising chamber
9. Only ______ percent of the effluent of the liquid chromatography must be introduced in the mass spectrometer.
1-2 %
1-5 %
1-20 %
1-15 %
10. Which of the following is the normal nebuliser temperature used in LC mass spectrometry?
50-100oC
100-200oC
125-150oC
150-200oC
11. The ions are focussed and de-clustered through which of the following regions?
Dry helium region
Wet oxygen region
Wet chlorine region
Dry nitrogen region
12. The ions are passed into the high vacuum analyser through which of the following?
Orifice
Nozzle
Nebulizer
Venturi tube
13. Using an interface would reduce detection limit and sensitivity.
True
False
all of the above
None of the mentioned
14. Gas burden from conventional LC flow rates is which of the following?
1ml/min of water produces 1.2 l/mm of gas
1ml/min of water produces 2.4 l/mm of gas
2ml/min of water produces 3.2 l/mm of gas
1ml/min of water produces 4.2 l/mm of gas
15. Tandem mass spectroscopy combines which of the following devices?
Mass spectrometer and gas-solid chromatograph
Mass spectrometer and gas-liquid chromatograph
Mass spectrometer and gas chromatograph
Mass spectrometer and mass spectrometer
16. In tandem spectroscopy, the first stage sepatation device is a mass spectrometer.
True
False
all of the above
None of the mentioned
17. Which of the following is used to separate a single mass that is characteristic of a given analyte in a mixture?
First mass spectrometer
Second mass spectrometer
Filter
Precursor
18. The mass-selected ions are activated in which of the following ways that cause them to fall apart to produce product ions?
Collisional activation
Evaporational activation
Inert gas activation
Thermal activation
19. The final MS/MS spectrum consists only of product ions from the selected precursor.
True
False
all of the above
None of the mentioned
20. In reverse-geometry mass spectrometer which of the following precedes the electric sector?
Nebulizer
Orifice
Magnetic sector
Mass spectrometer
21. A magnetic sector alone can be used as a mass spectrometer, with roughly _____ resolution.
Low
High
Unit
infinite
22. What does the acronym ‘MIKES’ stand for?
Mass-analysed ion kinetic energy spectrometer
Mass-based induced kinetic energy spectrometer
Mass invasive kinetic electric spectrometer
Mass-analyser in a kinetic energy-type spectrometer
23. In MIKES experiments which of the following are measured?
Product ions
Product ion kinetic energies
Product ions mass to charge ratio
Product ions masses
24. All ions with the same number of charges will have ______
Same kinetic energy
Different kinetic energies
Same mass
Different mass
25. A tandem mass spectrometer has which of the following analysers?
Time of flight mass analyser
Magnetic deflection analyser
Radiofrequency analyser
Quadrupole analyser
26. Which of the following filters are used in tandem spectrometer?
Quadrupole mass filter
Low energy filter
High energy filter
Time of flight mass filter
27. B/E scan is which of the following scans?
Product ion scan
Precursor ion scan
Mass scan
Charge scan
28. Which of the following is located in the region between two analysers?
Nebuliser
Collision cell
Filter
Vacuum chamber
29. Surface is usually more than _____ atomic layer deep and is a region of ________ atomic potentials.
One, uniform
One, non-uniform
Two, uniform
Two, non-uniform
30. Surface analysis can provide information that classic methods like microscopic cannot.
True
False
all of the above
None of the mentioned
31. In surface spectrometer, which of the following beam is analysed?
Reflected beam
Absorbed beam
Refracted beam
Incident beam
32. Which of the following is a type of electron spectroscopy?
MIKES
Auger spectroscopy
Secondary ion mass spectroscopy
Ion scattering spectroscopy
33. Surface analysis cannot provide any chemical information directly.
True
False
all of the above
None of the mentioned
34. Which of the following is also known as X-ray photoelectron spectroscopy?
Auger electron spectroscopy
Electron impact spectroscopy
Electron spectroscopy for chemical analysis
Secondary ion mass spectroscopy
35. Which of the following methods utilizes the emission of low energy electrons in a process?
Auger electron spectroscopy
Electron impact spectroscopy
Electron spectroscopy for chemical analysis
Secondary ion mass spectroscopy
36. Which of the following is the abbreviation of ESCA?
Electron scattering chemical analysis
Emission spectroscopy combination analysis
Electron spectroscopy for chemical analysis
Electron spectrum chemically analysed
37. Which of the following methods use soft X-rays to eject electrons from inner shell orbitals?
Auger electron spectroscopy
Electron impact spectroscopy
Electron spectroscopy for chemical analysis
Secondary ion mass spectroscopy
38. Which of the following is the abbreviation of SIMS?
Secondary ion mass spectroscopy
Spectrum ionization mass spectroscopy
Scattering ions mass spectroscopy
Spectral ionization mass spectroscopy
39. The kinetic energy of the photoelectron energies is dependent on _________ of the atom, which makes XPS useful to identify the oxide state.
Mass
Charge
Chemical environment
Volume
40. Ion etching techniques provides the depth profiling from the surface.
True
False
all of the above
None of the mentioned
41. Electron spectroscopy is based on the ionization phenomenon.
True
False
all of the above
None of the mentioned
42. The kinetic energy of the ejected photoelectron is dependent upon the energy of which of the following?
Ions around
Photons around
Material
Impinging photon
43. ESCA gives sufficient chemical information up to a depth about ________ armstrong in metals.
5-20
15-40
40-100
100-200
44. ESCA gives sufficient chemical information up to a depth about ________ armstrong in polymers.
5-20
15-40
40-100
100-200
45. ESCA gives sufficient chemical information up to a depth about ________ armstrong in oxide.
5-20
15-40
40-100
100-200
46. ESCA can identify elements in the periodic table above which of the following?
Carbon
Boron
Helium
Potassium
47. Discrete electrons cannot be observed in electron ionization of an atom due to which of the following reasons?
Environmental disturbances
Same mass
Same charge
Electron- electron interaction
48. ESCA focusses on which of the following information?
Mass of the electron
Charge of the electron
Binding energy of the electron
Mass of atoms
49. In the spectrum, two main peaks at _________ and ________ are observed.
284.6, 532.5
248.6, 523.5
264.8, 535.2
246.8, 553.2
50. 284.6 eV matches which of the following specific atom type?
Carbon
Oxygen
Nitrogen
Argon
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